Quantity | Price(USD) | Ship Date |
---|---|---|
1-10 | TBD | |
10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.
Low magnification with a large field of view + flat field correction, ensuring overall clarity within a 25mm field of view (FN25), and dual bright and dark field modes suitable for thick samples.
Applications include:
Preliminary screening of surface defects on metal sheets, macroscopic observation of 20mm thick bulk samples (such as aluminum blocks), and global positioning of wafers (to avoid lens collisions).
NA | 0.15 | WD | 20mm |
R | 1.8um | ±D.F | 12um |
Quantity | Price(USD) | Ship Date |
---|---|---|
1-10 | TBD | |
10- | TBD |