VenusLab DIC-IIM

Professional industrial inspection microscopes equipped with DIC technology

DIC High-Definition Imaging: Reveals fine textures, solves the problems of high reflection / low contrast observation
Strong industrial adaptability: Dual modes + lifting stage, efficiently inspect workpieces of different thicknesses

Overview

Industrial-grade DIC High-Definition Inspection Microscope

VenusLab DIC-IIM is a differential interference contrast microscope specially designed for precision industrial quality inspection. Equipped with a professional DIC optical system, it can realize dual-mode observation of bright field and differential interference contrast, and can clearly present the subtle surface textures and structural defects of workpieces with high reflectivity and low contrast. Combined with a lifting device and a mechanical stage, it is suitable for efficient inspection of industrial samples of different thicknesses, and is widely used in quality inspection links in fields such as precision electronics and hardware parts.

Features of VenusLab DIC-IIM

DIC high-definition imaging, solving the problem of observing high-reflection / low-contrast samples
Brightfield / DIC dual-mode switching, adapting to various industrial inspection needs
Lifting device + mechanical stage, efficiently positioning workpieces of different thicknesses