电学型

Typical applications:

• High-temperature stability testing of conventional perovskite devices (such as temperature-dependent electrical performance analysis of perovskite photovoltaic materials);
• Dielectric constant testing of inorganic non-metallic materials (such as ceramics) at medium-high temperatures (500-1000℃);
• Temperature-dependent resistivity testing of larger-sized (Φ16-22mm) metal sheets.

Typical applications:

• Ultra-high temperature resistivity testing above 1000°C for high-temperature resistant materials (such as superalloys, high-temperature semiconductors);
• Verification of extreme high-temperature electrical properties of miniaturized perovskite chips (Φ16mm and below);
• Electrical signal stability testing of electronic components (such as high-temperature sensors) at the extreme temperature of 1200°C.

It has a wide temperature range, and the probe is easy to replace and position.

Applications: Electrical performance testing of semiconductor devices at high and low temperatures, research on thermal stability of materials.

Stable temperature control at medium and low temperatures, and vacuum environment to prevent interference.

Applications: Medium and low temperature electrical tests requiring a vacuum environment, such as organic semiconductor research.

Wide temperature range and stable probe position.

Application: Long-term tests with high requirements for probe stability, such as material aging experiments.

Accurate temperature control at medium and low temperatures, and a pure vacuum environment.

Application: Performance testing of medium and low temperature electronic components in a vacuum environment.

No liquid nitrogen required, easy to operate, and low energy consumption.

Application: Testing near room temperature, such as sensor performance detection.

No liquid nitrogen required, and vacuum environment testing is convenient.

Application: Electrical testing near room temperature that requires a vacuum.

Small in size, suitable for oil bath testing.

Low-temperature testing in oil baths with limited space, such as small electronic modules.

Good high-temperature performance and flexible probes.

Applications: Conductivity testing of high-temperature materials, calibration of high-temperature sensors.

Ultra-high temperature resistance and long-term stability.

Applications: Performance testing of ultra-high temperature materials, such as research on high-temperature electrical properties of ceramics.

The maximum temperature reaches 1000℃, with excellent high-temperature performance.

Applications: Testing of material properties under extreme high temperatures, such as research on refractory materials.

The upper temperature limit is higher, reaching 1200℃, which meets the needs of higher temperature testing.

Application: Testing the electrical properties of special materials (such as superalloys) in ultra-high temperature environments.

Tungsten probes are used, which are resistant to high temperatures and have high hardness, making them suitable for stable testing under high temperatures.

Applications: Tests that require high probe hardness at high temperatures, such as research on the performance of high-temperature semiconductor devices.

It has strong low-temperature control capability (minimum -190℃), and the built-in displacement stage has a compact structure, making it suitable for experimental scenarios with limited space.

The silver sample stage has uniform thermal conductivity, ensuring the temperature consistency of the sample at low temperatures.

The external displacement stage facilitates the loading and unloading of samples during experiments, offering greater operational flexibility.

Bellows connection reduces vibration interference, ensures the precision of probe contact, and is suitable for tests that require frequent sample replacement.

No liquid nitrogen consumption, low operating cost and safe operation; the copper sample stage is larger in size, suitable for larger-sized samples.

The temperature control rate reaches 30℃/min, with balanced heating and cooling efficiency.

It has strong ultra-high temperature resistance and can operate stably for a long time. The XYZ axis stroke is the largest, and the probe adjustment range is wider.

The tungsten-rhenium probe is resistant to high temperatures and is suitable for ultra-high temperature testing needs.

Wide temperature range adaptation for extreme temperature electrical testing, expanding application scenarios, such as high and low temperature performance testing of semiconductor materials. High-precision electronic control, stable temperature control, and vacuum chambers reduce interference, ensuring accurate and reliable test data.

Excellent optical performance, which can be combined with microscopes, spectrometers, etc., to achieve synchronous testing of optoelectronic performance and meet multi-dimensional needs.