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VL Plan Apo Brightfield Observation Objective Lens
Widely used in metallographic defect detection, semiconductor chip observation, and material microscopic analysis
- Flat-field apochromatic: "No chromatic aberration, no blurring" across the entire field of view
- Long working distance: Suitable for thick/bulging samples
- Infinite optical path: Strong expandability
- Exclusive for metallography: Adaptable without a cover glass
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Overview
Introduction:
- Infinite conjugation, 95mm parfocal distance
• 400-700nm visible spectrum chromatic aberration correction
• FN40mm field of view, flat field correction and clear edges
• Long working distance
Explore Series
VL Plan Apo Brightfield Observation Objective Lens
VL Plan Apo 2X (FN 40）
Long working distance, infinity correction.
VL Plan Apo Brightfield Observation Objective Lens
M Plan Apo 5X（FN 40）
Long working distance, infinite correction.
VL Plan Apo Brightfield Observation Objective Lens
M Plan Apo 10X（FN 40）
Long working distance, infinity correction.
