| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

NA=0.6 balances resolving power (0.5μm) and working distance (9.5mm), allowing observation of submicron structures without oil immersion; the value of flat-field design is prominent: the entire field of view is clear at 20x magnification, compatible with 1" cameras (0.48×0.64mm field of view) for capturing distortion-free images.
Applications:
Fine structures of organelles (such as mitochondrial cristae, Golgi apparatus);
Measurement of semiconductor circuit line width (≤1μm line width);
Detection of interlayer defects in thin films (such as delamination of photovoltaic films).
| NA | 0.6 | WD | 9.5mm |
| ±D.F | 0.76μm | Φ24 Eyepiece Field of View | 1.2mm |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |