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VL Plan Apo EPI Brightfield Observation Objective Lens

Part Number: VL Plan Apo EPI 100X

Apochromatic correction + flat-field design ensures consistent sharpness between the edge and center of the entire field of view (0.25mm), maintaining a high resolution of 0.29μm even at 100× high magnification, making it suitable for nanoscale structure observation.

Applications:
Nanoscale scratch/short circuit detection of chips, microtopography analysis of nanomaterials such as graphene, ultra-high magnification detailed research on metal grain boundaries.

Caution

Product image is for representative purposes only and not reflective of every product available on this page.

Configured Specifications

NA	0.95	WD	0.35mm
R	0.29um	±D.F	0.3um

Unit Price

Total

Ship Date

TBD

Qty.

Quantity	Price(USD)	Ship Date
1-10		TBD
10-		TBD

NOTE : Ship Dates above are subject to change depending upon availability.

Explore Series

VL Plan Apo EPI Brightfield Observation Objective Lens

VL Plan Apo EPI 50X

Full visible light band, high-resolution imaging

Ships as soon as Same Day

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