| Model | Core Configuration Highlights | Application Scenario |
|---|
| VL U-Met 3230 | Brightfield objective + 12V30W illumination | Basic metallographic observation |
| VL U-Met 320 | Multi-color filter + built-in polarization module | Polarization observation scenarios |
| VL U-Met 322 | Transmitted/reflective dual illumination system | Transmissive/reflective sample compatibility analysis |
| VL U-Met 323B | Brightfield/darkfield objective + 12V50W illumination | High-brightness darkfield observation |
| VL U-Met 302 | Trinocular head + 0.7μm fine focus adjustment | High-precision microscopic imaging |
| VL U-Met 302B | Brightfield/darkfield objective + large-size stage | Darkfield inspection of large samples |
| VL U-Met 101 | Long-working-distance objective + 154×154mm stage | Routine observation of uncovered samples |
| VL U-Met 101A | Long-working-distance objective + 204×204mm stage | Observation of large-size uncovered samples |
| VL U-Met 300 | Long-working-distance objective + 63×50mm stage | Metallographic analysis of small samples |
| VL U-Met 203A | Spring-loaded objective + 4-position nosepiece | Spring-loaded objective compatible scenarios |
| VL U-Met 203B | Spring-loaded objective + 5-position nosepiece | Multi-objective switching scenarios |
| VL U-Met 202A | 6V20W illumination + 4-position nosepiece | Low-power consumption illumination scenarios |
| VL U-Met 202B | 6V20W illumination + 5-position nosepiece | Low-power consumption + multi-objective switching scenarios |
| VL U-Met 200A | Long-working-distance objective + double-layer stage | Observation of standard-size samples |
| VL U-Met 200B | Long-working-distance objective + 5-position nosepiece | Standard sample analysis with multi-objective compatibility |