SiC-EUV-AG 光电探测器

Introduction:

SiC-EUV-AG is a SiC-based extreme ultraviolet photodetector covering the 5–125nm EUV wavelength range. It integrates 8-level adjustable gain, is equipped with a vacuum flange for high vacuum compatibility, and features high-flux radiation

tolerance, low dark current, and visible-blind characteristics, precisely suited for extreme ultraviolet measurement scenarios.

Features:

• High stability, long service life, and resistance to high-flux EUV radiation;

• Visible-blind, low dark current;

• High responsivity at 13.5nm EUV wavelength;

• Vacuum flange structure, compatible with high vacuum levels;

• Excellent performance, high cost-effectiveness, and comprehensive technical support;

• Non-standard customization services are available.