"Long-distance + medium magnification" balance: The combination of a 30.5mm working distance and 5× magnification not only retains a large operating space (suitable for fixtures and light sources) but also improves the resolution to 2.1μm, enabling observation of medium-level details (such as LCD pixel arrays and chip packaging contours). Multi-band compatibility: Achromatic aberration correction in the 355-532nm range, supporting simultaneous ultraviolet laser processing and visible light observation (e.g., real-time monitoring of laser cutting areas).

Applications:
Defect detection in electronic component packaging, "regional-level" detail observation in laser micromachining.