M Plan Apo Series Objectives

Ultra-long working distance of 41mm, which can almost accommodate finger operations, suitable for large samples or scenarios requiring tool intervention; Medium and low magnification transition: 2.8μm resolution, significantly improved compared to 1X/2X, balancing field of view and details.

Applied to ：

electronic component inspection (such as PCB boards), mineral particle observation, and local fine analysis of large-volume samples.