| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

Near-diffraction-limited resolution, with flat-field correction ensuring clarity across the entire 1mm field of view (FN25÷50), and accurate color reproduction of microstructures.
Applications include:
Metallographic structure analysis (distinction between martensite/austenite), localization of nanoscale defects in wafers (abnormal oxide layers), and thin-film pinhole detection (dark field).
| NA | 0.8 | WD | 1mm |
| R | 0.34um | ±D.F | 0.43um |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |