Balancing long working distance and high resolution: A 10.4mm working distance preserves operational space, while a 0.55μm resolution enables submicron-level observation; Color accuracy: Semi-apochromatic correction for red and blue light aberrations, ensuring no color fringing interference in scenarios such as metal inclusions and chip solder joints.
Applications include:
Analysis of the distribution of metal grain refiners (bright field), submicron defect localization in semiconductor wafers (dark field), and micro-wear detection of precision mold cavities.
| NA | 0.5 | WD | 10.4mm |
| R | 0.55um | ±D.F | 1.1um |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
