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Plan Fluor EPI Series Objectives
Widely used in metal grain analysis, chip defect detection, and coating observation
• Semi-apochromatic: Fluoride enables precise color rendering
• Flat field design: Clear view across the entire field without blind spots
• Episcopic EPI illumination: Customized for opaque samples
• Infinite conjugate parfocality: Significantly improves efficiency when changing magnifications
• Long working distance (for some models): Compatible with thick / raised samples
Overview
Introduction:
- 45mm Infinite Conjugate Parfocal Industrial Objective Lens
- Coaxial Illumination Brightfield Objective Lens
- Flat-Field Semi-Apochromatic Design
- High Imaging Contrast
- 5×-100× Series, Uniform Entrance Pupil Adapted for DIC Observation
Serivce & Support
