Front view of SiC-EUV-AG Photodetector
Front view of SiC-EUV-AG Photodetector

SiC-EUV-AG 光电探测器


Overview

Introduction:


SiC-EUV-AG is a SiC-based extreme ultraviolet photodetector covering the 5–125nm EUV wavelength range. It integrates 8-level adjustable gain, is equipped with a vacuum flange for high vacuum compatibility, and features high-flux radiation

tolerance, low dark current, and visible-blind characteristics, precisely suited for extreme ultraviolet measurement scenarios.


Features:


  • High stability, long service life, and resistance to high-flux EUV radiation;


  • Visible-blind, low dark current;


  • High responsivity at 13.5nm EUV wavelength;


  • Vacuum flange structure, compatible with high vacuum levels;


  • Excellent performance, high cost-effectiveness, and comprehensive technical support;


  • Non-standard customization services are available.

Specifcations

Adjustable gain parameters

Dimension

Responsivity

Serivce & Support

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