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VL CF Plan DI White Light Interference Objective Lens
Widely used in the full-process inspection of semiconductor manufacturing, three-dimensional analysis of two-dimensional materials
- Visual enhancement of differential interference contrast (DI)
- Nano-scale precision support from white light interference
- Ultimate balance between apochromatism and flat field
- Quantitative indicators of industrial-grade precision
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Overview
Introduction:
- Infinite conjugate parfocal distance 60mm
- For non-contact measurement of surface topography and geometric features
Explore Series
VL CF Plan DI White Light Interference Objective Lens
VL CF Plan 10X DI
DI visualization enhancement, white light interference quantitative analysis
VL CF Plan DI White Light Interference Objective Lens
VL CF Plan 20X DI
DI visualization enhancement, white light interference quantitative analysis
