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SiC-VUV-AG Photodetector

Part Number: SiC-180/200nm-5mm-AG8

Suitable for VUV coating uniformity inspection (covering a typical area in a single scan to enable rapid evaluation of coating quality) and plasma transient radiation diagnostics (capturing millisecond-level VUV pulse signals);


The high-flux VUV radiation resistance characteristic of SiC ensures long service life, the 8-level gain covers the full-scenario range from "weak signal analysis" to "strong pulse quantification", and the vacuum flange supports high-vacuum chamber integration.

Caution
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Configured Specifications

Photosensitive Sizeφ19.6mmResponse Time Constant<1uS
Outline Dimensions50mm X 38.9mm X 70mmNet Weight of the Detector0.10kg
Unit Price
Total
Ship Date
TBD
Qty.
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.

Explore Series

SiC-VUV-AG Photodetector

SiC-180/200nm-1 X 1mm-AG8
1×1mm square photosensitive surface, matching the φ1mm circular photosensitive dimension, focuses on nanoscale spatial resolution (breaking through the micro-region detection limit of conventional detectors).
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SiC-VUV-AG Photodetector

SiC-180/200nm-2.5X2.5mm-AG8
2.5×2.5mm square photosensitive surface, corresponding to a φ6.25mm circular photosensitive dimension, balances micro-region precision and energy collection efficiency.
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SiC-VUV-AG Photodetector

SiC-180/200nm-5×5mm-AG8
5×5mm square photosensitive surface, corresponding to a φ25mm circular photosensitive dimension, focusing on wide-range VUV energy collection and breaking through the conventional detection area limit.
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SiC-VUV-AG Photodetector

SiC-180/200nm-9mm-AG8
9mm circular photosensitive dimension (diameter φ63.5mm), enabling ultra-large-area low-light signal collection and filling the gap in wide-range low-illuminance VUV detection.
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