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SiC-VUV-AG Photodetector

Part Number: SiC-180/200nm-9mm-AG8

Suitable for VUV light source far-field distribution testing (wide-area coverage of low-illuminance signals to restore the spatial distribution characteristics of the light source) and large-area coating uniformity inspection (covering an ultra-large area in a single scan to improve inspection efficiency);


The vacuum flange supports high-vacuum chamber integration, and the adjustable gain breaks through the dynamic range bottleneck of traditional detectors, enabling flexible switching between "wide-area low light" and "local strong light" to meet the testing needs of complex scenarios.

Caution
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Configured Specifications

Photosensitive Sizeφ63.5mmResponse Time Constant<2uS
Outline Dimensions50mm X 38.9mm X 70mmNet Weight of the Detector0.10kg
Unit Price
Total
Ship Date
TBD
Qty.
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.

Explore Series

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1×1mm square photosensitive surface, matching the φ1mm circular photosensitive dimension, focuses on nanoscale spatial resolution (breaking through the micro-region detection limit of conventional detectors).
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2.5×2.5mm square photosensitive surface, corresponding to a φ6.25mm circular photosensitive dimension, balances micro-region precision and energy collection efficiency.
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5mm circular photosensitive dimension (diameter φ19.6mm), focusing on high-efficiency energy capture over a medium area, and suitable for conventional VUV testing scenarios.
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SiC-VUV-AG Photodetector

SiC-180/200nm-5×5mm-AG8
5×5mm square photosensitive surface, corresponding to a φ25mm circular photosensitive dimension, focusing on wide-range VUV energy collection and breaking through the conventional detection area limit.
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