| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

High magnification, full field of view with uniform clarity. The improved NA achieves submicron resolution, and the flat-field design ensures that there is no edge blurring in the 4mm field of view (FN25÷20×).
Applications:
Semiconductor chip circuit inspection (eliminating false judgments caused by color fringing), metal inclusion analysis (compatible with DIC to enhance stereoscopic effect).
| NA | 0.45 | WD | 3mm |
| R | 0.6um | ±D.F | 1.4um |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |