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VL Plan Fluor EPI Brightfield Observation Objective Lens

Part Number: VL Plan Fluor EPI 20X

High magnification, full field of view with uniform clarity. The improved NA achieves submicron resolution, and the flat-field design ensures that there is no edge blurring in the 4mm field of view (FN25÷20×).


Applications:
Semiconductor chip circuit inspection (eliminating false judgments caused by color fringing), metal inclusion analysis (compatible with DIC to enhance stereoscopic effect).

Caution
  • Product image is for representative purposes only and not reflective of every product available on this page.

Configured Specifications

NA0.45WD3mm
R0.6um±D.F1.4um
Unit Price
Total
Ship Date
TBD
Qty.
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.

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