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Solid-State Integrated EUV Detection Solution
SiC-EUV-AG is a SiC-based extreme ultraviolet photodetector covering the 5–125nm EUV wavelength range. It integrates 8-level adjustable gain, is equipped with a vacuum flange for high vacuum compatibility, and features high-flux radiation tolerance, low dark current, and visible-blind characteristics, precisely suited for extreme ultraviolet measurement scenarios.
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