| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

Applicable to EUV lithography exposure dose monitoring (large-area uniform radiation measurement) and plasma diagnostics (capturing transient high-intensity radiation);
The high-flux radiation resistance characteristic of SiC ensures a long service life, and its 8-level adjustable gain covers the full-scenario range from "weak signal analysis" to "strong pulse quantification".
| Photosensitive Size | φ25mm | Response Time Constant | <2uS |
| Outline Dimensions | 50mm X 38.9mm X 70mm | Net Weight of the Detector | 0.10kg |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |