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VL CF Plan TI/DI White Light Interference Objective Lens
Widely used in fields such as semiconductors (wafer defects / film thickness), optical components (surface flatness), precision manufacturing (part roughness)
• Nanoscale non-contact precision
• Serial scene adaptation
• Industry universal benchmark
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Overview
Introduction:
- Infinite conjugate
- 45mm parfocal
- Non-contact measurement of surface topography and geometric features
Explore Series
VL CF Plan TI/DI White Light Interference Objective Lens
VL CF Plan 5X TI
Non-contact nanoscale high-precision measurement
VL CF Plan TI/DI White Light Interference Objective Lens
VL CF Plan 10X TI
Non-contact nanoscale high-precision measurement
VL CF Plan TI/DI White Light Interference Objective Lens
VL CF Plan 20X TI
Non-contact nanoscale high-precision measurement
