Front view of SiC-EUV-AG Photodetector
Front view of SiC-EUV-AG Photodetector

SiC-EUV-AG Photodetector

Solid-State Integrated EUV Detection Solution

  • Fundamental Advantages Empowered by Wide-Bandgap Materials
  • Precise Response Capability in the EUV Band
  • Functional Upgrade of AG (Enhanced Gain)
  • Stable Adaptability to Extreme Environments
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Data Sheet

Overview

Introduction:


SiC-EUV-AG is a SiC-based extreme ultraviolet photodetector covering the 5–125nm EUV wavelength range. It integrates 8-level adjustable gain, is equipped with a vacuum flange for high vacuum compatibility, and features high-flux radiation tolerance, low dark current, and visible-blind characteristics, precisely suited for extreme ultraviolet measurement scenarios.


Features:


  • High stability, long service life, and resistance to high-flux EUV radiation;
  • Visible-blind, low dark current;
  • High responsivity at 13.5nm EUV wavelength;
  • Vacuum flange structure, compatible with high vacuum levels;
  • Excellent performance, high cost-effectiveness, and comprehensive technical support;
  • Non-standard customization services are available.


Dimension:


Specifications

Adjustable Gain Parameters

Responsivity

Serivce & Support

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