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SiC-VUV-AG Photodetector

Part Number: SiC-180/200nm-5mm-AG8

Suitable for VUV coating uniformity inspection (covering a typical area in a single scan to enable rapid evaluation of coating quality) and plasma transient radiation diagnostics (capturing millisecond-level VUV pulse signals);


The high-flux VUV radiation resistance characteristic of SiC ensures long service life, the 8-level gain covers the full-scenario range from "weak signal analysis" to "strong pulse quantification", and the vacuum flange supports high-vacuum chamber integration.

Images are for display purposes only.

Specifications

Photosensitive SizeResponse Time ConstantOutline DimensionsNet Weight of the Detector
φ19.6mm<1uS50mm X 38.9mm X 70mm0.10kg
Unit Price
Total
Ship Date
TBD
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.
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