"Long-distance + medium magnification" balance: The combination of a 30.5mm working distance and 5× magnification not only retains a large operating space (suitable for fixtures and light sources) but also improves the resolution to 2.1μm, enabling observation of medium-level details (such as LCD pixel arrays and chip packaging contours). Multi-band compatibility: Achromatic aberration correction in the 355-532nm range, supporting simultaneous ultraviolet laser processing and visible light observation (e.g., real-time monitoring of laser cutting areas).
Applications:
Defect detection in electronic component packaging, "regional-level" detail observation in laser micromachining.
| NA | WD | ±D.F | Φ24 Eyepiece Field of View |
|---|---|---|---|
| 0.13 | 30.5mm | 16.3um | 4.8mm |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
