M Plan Apo FN40 Series Objectives

Low magnification with a large field of view + ultra-long working distance, flat-field apochromatism ensures clear edges of the 20mm field of view; achromatism across the entire 400-700nm wavelength range, with no "color fringing" in colors.

Applications:
Macro scanning of large-sized samples (such as preliminary screening of surface defects on metal plates, global positioning of wafers). The long working distance allows direct observation of bulk samples up to 20mm thick without removing accessories.