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M Plan Apo FN40 Series Objectives
Widely used in metallographic defect detection, semiconductor chip observation, and material microscopic analysis
- Flat-field apochromatic: "No chromatic aberration, no blurring" across the entire field of view
- Long working distance: Suitable for thick/bulging samples
- Infinite optical path: Strong expandability
- Exclusive for metallography: Adaptable without a cover glass
Overview
Introduction:
- Infinite conjugation, 95mm parfocal distance
- 400-700nm visible spectrum chromatic aberration correction
- FN40mm field of view, flat field correction and clear edges
- Long working distance
Serivce & Support
Explore Series
Model
NA
±D.F
Φ24 Eyepiece Field of View
WD
Action
