| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

Low magnification with a large field of view + ultra-long working distance, and flat-field correction ensures global clarity across a 20mm field of view (under FN25).
Applications include:
Preliminary screening of metal sheet defects, macroscopic observation of thick samples (≤20mm), and global positioning of wafers (to avoid accessory collisions).
| NA | 0.15 | WD | 20mm |
| R | 1.8um | ±D.F | 12um |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |