VL Plan Fluor EPI Brightfield Observation Objective Lens

Front view
Front view
Appearance dimension diagram

Widely used in metal grain analysis, chip defect detection, and coating observation


• Semi-apochromatic: Fluoride enables precise color rendering
• Flat field design: Clear view across the entire field without blind spots
• Episcopic EPI illumination: Customized for opaque samples
• Infinite conjugate parfocality: Significantly improves efficiency when changing magnifications
• Long working distance (for some models): Compatible with thick / raised samples

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Overview

Introduction:

  • 45mm Infinite Conjugate Parfocal Industrial Objective Lens
  • Coaxial Illumination Brightfield Objective Lens
  • Flat-Field Semi-Apochromatic Design
  • High Imaging Contrast
  • 5×-100× Series, Uniform Entrance Pupil Adapted for DIC Observation



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Flat-field semi-apochromatic, compatible with coaxial illumination.
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