| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |
NOTE : Ship Dates above are subject to change depending upon availability.

High-power extreme resolution, flat-field design to offset field curvature, semi-apochromatic to ensure no color deviation, 45mm parfocal length for operational safety.
Applications:
Semiconductor chip nano-defect detection (circuit short circuits, oxide layer abnormalities), microscopic observation of ultra-precision materials (graphene).
| NA | 0.9 | WD | 1mm |
| R | 0.31um | ±D.F | 0.34um |
| Quantity | Price(USD) | Ship Date |
|---|---|---|
| 1-10 | TBD | |
| 10- | TBD |