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VL Plan Fluor EPI Brightfield Observation Objective Lens

Part Number: VL Plan Fluor EPI 100X

High-power extreme resolution, flat-field design to offset field curvature, semi-apochromatic to ensure no color deviation, 45mm parfocal length for operational safety.


Applications:
Semiconductor chip nano-defect detection (circuit short circuits, oxide layer abnormalities), microscopic observation of ultra-precision materials (graphene).

Caution
  • Product image is for representative purposes only and not reflective of every product available on this page.

Configured Specifications

NA0.9WD1mm
R0.31um±D.F0.34um
Unit Price
Total
Ship Date
TBD
Qty.
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.

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